AUSTIN, Texas, Aug. 10 -International Test Conference, the highlight of the annual Test Week(TM) activities and the leading forum for electronics test technology, promises to engage and stimulate attendees from the test and design community with its technical program and activities when the doors open at the 36th annual ITC. The theme for this year's conference is Test: Survival of the Fittest. Test Week 2005 runs from November 6 through November 11 at the Austin Convention Center in Austin, Texas. ITC's Advance Program and on-line registration are available on its Web site at http://www.itctestweek.org.
ITC 2005 Abounds with Technical Offerings and Educational Opportunities
ITC, the cornerstone of the Test Week event, is known worldwide for the strength of its technical program, which attracts many top researchers, and industry experts who choose ITC to present the results of their work. Offerings throughout the week incorporate a wide variety of technical activities targeted at test and design theoreticians and practitioners, including: formal paper sessions, tutorials, panel sessions, lecture and application series, workshops, commercial exhibits and a host of professional fringe meetings. Taken together, these activities provide a week-long educational experience that will benefit people new to testing and experts.
This year the International Test Conference technical program together with other Test Week 2005 events will support the theme of Test: Survival of the Fittest, emphasizing the highly competitive and evolutionary as well as revolutionary environment that exists in test technology. The program will focus on topics such as on-chip test data compression techniques, yield improvement using test data collecting and analysis, and the gamut of challenges related to very-high-speed I/Os. Authors will present material on research topics as well as new developments in mixed-signal and RF testing, jitter testing, ATE hardware and software, delay-test, built-in self-test, microprocessor test, system-on-chip test, and much more.
The technical program contains 46 sessions, and is supplemented with a lecture and application series comprised of six sessions on a wide range of topics including emerging test standards, jitter, and "no-trouble-found" components. The popular dedicated track on board and system test continues as well.
A Dynamic Plenary Session Opens the Conference
The formal opening of the conference begins with the plenary session and a keynote address by Dr. John Kibarian, President, CEO and Director at PDF Solutions, Inc. Dr. Kibarian's discussion will focus on The Nature of Yield Ramping: Keeping Ahead of Evolution. ITC 2005's invited address will come from long-time ITC contributor, Dr. Janak Patel, Donald Biggar Willett Professor of Electrical and Computer Engineering at the University of Illinois at Urbana-Champaign. Dr. Patel's talk will address, Test Research: Past, Present and Future.
Companies Feature New Products at ITC
As always, the exhibition forms a major part of ITC. Concurrent with the technical program, an exhibit floor will feature the newest equipment, software and services from all over the world for solving testing problems. Owing to its ongoing success, the University Booth, offering an opportunity for the university community to demonstrate device/board/system testing research in areas including design verification, test, diagnosis, and failure analysis will again be on the exhibits floor.
Panels for All Interests
ITC continues its tradition of presenting thought-provoking panels exploring current issues challenging the test practitioner. This year's 10 panels include a diverse cross-section of test topics including reliability, diagnosis, wafer probe technology, and design for yield and manufacturability, and will feature a test compression "shootout," a timely discussion of DFT outsourcing, and a 10-round "boxing-style" match requiring industry experts (and the audience) to answer an unknown list of questions on a selection of test topics.
A Strong Start and Finish for Test Week
ITC Test Week kicks off with 16 one-day tutorials presented by the IEEE Computer Society's Test Technology Technical Council (TTTC) on the two days prior to the conference technical program, November 6 and 7. They are geared for entry-level attendees as well as those wishing to expand their knowledge in a particular area, and cover such topics as high-speed test interfaces, silicon debug, memory test, test engineering, mixed-signal test, and board test.
Closing out Test Week are three workshops, including the well-received Electronic System Test and GHz/Gbps Test workshops. Our new-to-ITC workshop this year is the Silicon Debug and Diagnosis workshop. These workshops provide in-depth and up-to-the-minute views of work in these important test areas.
About ITC
ITC is sponsored by the Test Technology Council of the IEEE Computer Society and by the Philadelphia Section of the IEEE. From its beginnings as an informal gathering of engineers in 1970 at Cherry Hill, New Jersey, ITC has grown into the Test Week event, with more than a hundred papers, panels, an exhibition, tutorials, workshops, lecture and application series sessions, case studies, and important keynote speeches.
ITC is known for a tradition of spirited debates over test issues that continue during breaks and social gatherings. A multitude of companies choose ITC to demonstrate major new test products and services in the concurrent exhibition.
Celebrating its 36th conference year, ITC, the cornerstone of the Test Week activities, will take place at the Austin Convention Center in Austin, Texas, from November 8 - 10. Test Week runs November 6 - 11. The Advance Program and registration information are available on-line at http://www.itctestweek.org or from the ITC office by telephone at +1 202.973.8665.
ITC gratefully acknowledges its sponsors and Diamond- and Platinum-level corporate supporters:
Sponsors:
IEEE
IEEE Computer Society
Diamond-level Supporter:
Optimal Test
Platinum-level Supporters:
Advantest
Mentor Graphics
Teradyne
